Publications
Electron Microscopy and Techniques

  1. J.M. Zuo, A.B. Shah, H. Kim, Y.F. Meng, W.P. Gao, J.L. Rouviere, Lattice
    and strain analysis of atomic resolution Z-contrast images based on
    template matching, Ultramicroscopy, 136 (2014) 50-60.
  2. A.B. Shah, S.T. Sivapalan, B.M. DeVetter, T.K. Yang, J.G. Wen, R.
    Bhargava, C.J. Murphy, J.M. Zuo, High-Index Facets in Gold Nanocrystals
    Elucidated by Coherent Electron Diffraction, Nano Letters, 13 (2013)
    1840-1846.
  3. K.-H. Kim, J.-M. Zuo, Symmetry quantification and mapping using
    convergent beam electron diffraction, Ultramicroscopy, 124 (2013) 71-76.
  4. K.H. Kim, D.A. Payne, J.M. Zuo, Determination of fluctuations in local
    symmetry and measurement by convergent beam electron diffraction:
    applications to a relaxor-based ferroelectric crystal after thermal
    annealing, Journal of Applied Crystallography, 46 (2013) 1331-1337.
  5. K. Ran, J.-M. Zuo, Q. Chen, Z. Shi, Electrons for single molecule
    diffraction and imaging, Ultramicroscopy, 119 (2012) 72-77.
  6. J.M. Zuo, J. Zhang, W.J. Huang, K. Ran, B. Jiang, Combining Real and
    Reciprocal Space Information for Aberration Free Coherent Electron
    Diffractive Imaging Ultramicroscopy, 111 (2011) 817-823.
  7. J.M. Zuo, J. Tao, Scanning Electron Nanodiffraction and Diffraction
    Imaging, in: S. Pennycook, P. Nellist (Eds.) Scanning Transmission
    Electron Microscopy, Springer, New York, 2011.
  8. J.S. Wu, Y.S. Zhao, H.F. Hu, J.X. Huang, J.M. Zuo, V.P. Dravid,
    Construction of an organic crystal structural model based on combined
    electron and powder X-ray diffraction data and the charge flipping
    algorithm, Ultramicroscopy, 111 (2011) 812-816.
  9. A.B. Shah, Q.M. Ramasse, J.G. Wen, A. Bhattacharya, J.M. Zuo, Practical
    spatial resolution of electron energy loss spectroscopy in aberration
    corrected scanning transmission electron microscopy, Micron, 42 (2011)
    539-546.
  10. K. Ran, J.M. Zuo, Q. Chen, Z.J. Shi, Electron Beam Stimulated Molecular
    Motions, Acs Nano, 5 (2011) 3367-3372.
  11. J.G. Wen, J. Mabon, C.H. Lei, S. Burdin, E. Sammann, I. Petrov, A.B.
    Shah, V. Chobpattana, J. Zhang, K. Ran, J.M. Zuo, S. Mishina, T. Aoki,
    The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron
    Probes in the Aberration-Corrected Transmission Electron Microscope at
    the University of Illinois, Microscopy and Microanalysis, 16 (2010) 183-
    193.
  12. A.B. Shah, Q.M. Ramasse, X.F. Zhai, J.G. Wen, S.J. May, I. Petrov, A.
    Bhattacharya, P. Abbamonte, J.N. Eckstein, J.M. Zuo, Probing Interfacial
    Electronic Structures in Atomic Layer LaMnO3 and SrTiO3 Superlattices,
    Advanced Materials, 22 (2010) 1156-+.
  13. S.I. Sanchez, M.W. Small, S. Sivaramakrishnan, J.G. Wen, J.M. Zuo, R.G.
    Nuzzo, Visualizing Materials Chemistry at Atomic Resolution, Analytical
    Chemistry, 82 (2010) 2599-2607.
  14. H. Park, J.M. Zuo, Comment on "Structural Preablation Dynamics of
    Graphite Observed by Ultrafast Electron Crystallography", Physical
    Review Letters, 105 (2010) 059603.
  15. T. Kim, S. Kim, E. Olson, J.M. Zuo, In situ measurements and transmission
    electron microscopy of carbon nanotube field-effect transistors,
    Ultramicroscopy, 108 (2008) 613-618.
  16. D. Jacob, J.M. Zuo, A. Lefebvre, Y. Cordier, Composition analysis of
    semiconductor quantum wells by energy filtered convergent-beam
    electron diffraction, Ultramicroscopy, 108 (2008) 358-366.
  17. W.J. Huang, R. Sun, J. Tao, L.D. Menard, R.G. Nuzzo, J.M. Zuo,
    Coordination-dependent surface atomic contraction in nanocrystals
    revealed by coherent diffraction, Nature Materials, 7 (2008) 308-313.
  18. J.M. Zuo, T. Kim, A. Celik-Aktas, J. Tao, Quantitative structural analysis of
    individual nanotubes by electron diffraction, Zeitschrift Fur
    Kristallographie, 222 (2007) 625-633.
  19. W.J. Huang, B. Jiang, R.S. Sun, J.M. Zuo, Towards sub-A atomic
    resolution electron diffraction imaging of metallic nanoclusters: A
    simulation study of experimental parameters and reconstruction
    algorithms, Ultramicroscopy, 107 (2007) 1159-1170.
  20. H. Chen, J.M. Zuo, Structure and phase separation of Ag-Cu alloy thin
    films, Acta Materialia, 55 (2007) 1617-1628.
  21. M. Gao, J.M. Zuo, R. Zhang, L.A. Nagahara, Structure determinations of
    double-wall carbon nanotubes grown by catalytic chemical vapor
    deposition, Journal of Materials Science, 41 (2006) 4382-4388.
  22. T. Kim, J.M. Zuo, E.A. Olson, I. Petrov, Imaging suspended carbon
    nanotubes in field-effect transistors configured with microfabricated slits
    for transmission electron microscopy, Applied Physics Letters, 87 (2005)
    173108.
  23. J.M. Zuo, Measurements of electron densities in solids: a real-space view
    of electronic structure and bonding in inorganic crystals, Reports on
    Progress in Physics, 67 (2004) 2053-2103.
  24. J.M. Zuo, I. Vartanyants, M. Gao, R. Zhang, L.A. Nagahara, Atomic
    resolution imaging of a carbon nanotube from diffraction intensities,
    Science, 300 (2003) 1419-1421.
  25. B. Jiang, J.M. Zuo, J. Friis, J.C.H. Spence, On the consistency of QCBED
    structure factor measurements for TiO2 (rutile), Microscopy and
    Microanalysis, 9 (2003) 457-467.
  26. M. Gao, J.M. Zuo, R.D. Twesten, I. Petrov, L.A. Nagahara, R. Zhang,
    Structure determination of individual single-wall carbon nanotubes by
    nanoarea electron diffraction, Applied Physics Letters, 82 (2003) 2703-
    2705.
  27. J.M. Zuo, U. Weierstall, L.M. Peng, J.C.H. Spence, Surface structural
    sensitivity of convergent-beam RHEED: Si (001)2x1 models compared
    with dynamical simulations, Ultramicroscopy, 81 (2000) 235-244.
  28. J.M. Zuo, J. Pacaud, R. Hoier, J.C.H. Spence, Experimental measurement
    of electron diffuse scattering in magnetite using energy-filter and imaging
    plates, Micron, 31 (2000) 527-532.
  29. J.M. Zuo, Electron detection characteristics of a slow-scan CCD camera,
    imaging plates and film, and electron image restoration, Microscopy
    Research and Technique, 49 (2000) 245-268.
  30. J.M. Zuo, M. Kim, M. O'Keeffe, J.C.H. Spence, Direct observation of d-
    orbital holes and Cu-Cu bonding in Cu2O, Nature, 401 (1999) 49-52.
  31. J.M. Zuo, Accurate structure refinement and measurement of crystal
    charge distribution using convergent beam electron diffraction,
    Microscopy Research and Technique, 46 (1999) 220-233.
  32. U. Weierstall, J.M. Zuo, T. Kjorsvik, J.C.H. Spence, Convergent-beam
    RHEED in a dedicated UHV diffraction camera and applications to Si
    reconstructed surfaces, Surface Science, 442 (1999) 239-250.
  33. J.C.H. Spence, B. Calef, J.M. Zuo, Dynamic inversion by the method of
    generalized projections, Acta Crystallographica Section A, 55 (1999) 112-
    118.
  34. L.M. Peng, J.M. Zuo, Anisotropic dispersion of the band structure and
    formation of ring patterns in CBED, Acta Crystallographica Section A, 55
    (1999) 1026-1033.
  35. X.M.H. Huang, J.M. Zuo, J.C.H. Spence, Wavefront reconstruction for in-
    line holograms formed by pure amplitude objects, Applied Surface
    Science, 148 (1999) 229-234.
  36. H.X. Gao, L.M. Peng, J.M. Zuo, Lattice dynamics and Debye-Waller
    factors of some compounds with the sodium chloride structure, Acta
    Crystallographica Section A, 55 (1999) 1014-1025.
  37. A.S. Avilov, A.K. Kuligin, U. Pietsch, J.C.H. Spence, V.G. Tsirelson, J.M.
    Zuo, Scanning system for high-energy electron diffractometry, Journal of
    Applied Crystallography, 32 (1999) 1033-1038.
  38. J.M. Zuo, M. Kim, R. Holmestad, A new approach to lattice parameter
    measurements using dynamic electron diffraction and pattern matching,
    Journal of Electron Microscopy, 47 (1998) 121-127.
  39. J.M. Zuo, Quantitative convergent beam electron diffraction, Materials
    Transactions Jim, 39 (1998) 938-946.
  40. M.Y. Kim, J.M. Zuo, J.C.H. Spence, Ab-initio LDA calculations of the mean
    Coulomb potential V-0 in slabs of crystalline Si, Ge and MgO, Physica
    Status Solidi a-Applied Research, 166 (1998) 445-451.
  41. J.C.H. Spence, J.M. Zuo, Does electron holography energy-filter?,
    Ultramicroscopy, 69 (1997) 185-190.
  42. G. Ren, J.M. Zuo, L.M. Peng, Accurate measurements of crystal structure
    factors using a FEG electron microscope, Micron, 28 (1997) 459-467.
  43. J.M. Zuo, M.R. McCartney, J.C.H. Spence, Performance of imaging plates
    for electron recording, Ultramicroscopy, 66 (1996) 35-47.
  44. J.M. Zuo, Electron detection characteristics of slow-scan CCD camera,
    Ultramicroscopy, 66 (1996) 21-33.
  45. J.M. Zuo, A.L. Weickenmeier, On the Beam Selection and Convergence in
    the Bloch-Wave Method, Ultramicroscopy, 57 (1995) 375-383.
  46. J.C.H. Spence, J.M. Zuo, M. Okeeffe, K. Marthinsen, R. Hoier, On the
    Minimum Number of Beams Needed to Distinguish Enantiomorphs in X-
    Ray and Electron-Diffraction, Acta Crystallographica Section A, 50 (1994)
    647-650.
  47. J.M. Zuo, J.C.H. Spence, J. Downs, J. Mayer, Measurement of Individual
    Structure-Factor Phases with 10th-Degree Accuracy - the 00.2 Reflection
    in Beo Studied by Electron and X-Ray-Diffraction, Acta Crystallographica
    Section A, 49 (1993) 422-429.
  48. J.M. Zuo, J.C.H. Spence, Coherent Electron Nanodiffraction from Perfect
    and Imperfect Crystals, Philosophical Magazine a-Physics of Condensed
    Matter Structure Defects and Mechanical Properties, 68 (1993) 1055-
    1078.
  49. J.M. Zuo, Automated Structure-Factor Refinement from Convergent-Beam
    Electron-Diffraction Patterns, Acta Crystallographica Section A, 49 (1993)
    429-435.
  50. J.M. Zuo, New Method of Bravais Lattice Determination, Ultramicroscopy,
    52 (1993) 459-464.
  51. J.C.H. Spence, J.M. Cowley, J.M. Zuo, Electron Holographic Study of
    Ferroelectric Domain-Walls - Comment, Applied Physics Letters, 62
    (1993) 2446-2447.
  52. W. Qian, J.C.H. Spence, J.M. Zuo, Transmission Low-Energy-Electron
    Diffraction (Tleed) and Its Application to the Low-Voltage Point-Projection
    Microscope, Acta Crystallographica Section A, 49 (1993) 436-445.
  53. M. Gajdardziskajosifovska, M.R. McCartney, W.J. Deruijter, D.J. Smith, J.
    K. Weiss, J.M. Zuo, Accurate Measurements of Mean Inner Potential of
    Crystal Wedges Using Digital Electron Holograms, Ultramicroscopy, 50
    (1993) 285-299.
  54. J.M. Zuo, Automated Lattice-Parameter Measurement from Holz Lines and
    Their Use for the Measurement of Oxygen-Content in Yba2cu3o7-Delta
    from Nanometer-Sized Region, Ultramicroscopy, 41 (1992) 211-223.
  55. J.C.H. Spence, J.M. Zuo, W. Qian, Atomic Resolution in Lensless Low-
    Energy Electron Holography - Comment, Physical Review Letters, 68
    (1992) 3256-3256.
  56. J.C.H. Spence, J.M. Zuo, Electron Microdiffraction, Plenum, New York,
    1992.
  57. J.M. Zuo, J.C.H. Spence, Automated Structure Factor Refinement from
    Convergent-Beam Patterns, Ultramicroscopy, 35 (1991) 185-196.
  58. J.M. Zuo, Perturbation-Theory in High-Energy Transmission Electron-
    Diffraction, Acta Crystallographica Section A, 47 (1991) 87-95.
  59. J.M. Zuo, J.C.H. Spence, M. Okeeffe, Bonding Charge-Density in Gaas -
    Reply, Physical Review Letters, 62 (1989) 2329-2329.
  60. J.M. Zuo, J.C.H. Spence, R. Hoier, Accurate Structure-Factor Phase
    Determination by Electron-Diffraction in Noncentrosymmetric Crystals,
    Physical Review Letters, 62 (1989) 547-550.
  61. J.M. Zuo, R. Hoier, J.C.H. Spence, 3-Beam and Many-Beam Theory in
    Electron-Diffraction and Its Use for Structure-Factor Phase Determination
    in Non-Centrosymmetric Crystal-Structures, Acta Crystallographica
    Section A, 45 (1989) 839-851.
  62. J.M. Zuo, K. Gjonnes, J.C.H. Spence, Fortran Source Listing for
    Simulating 3-Dimensional Convergent Beam Patterns with Absorption by
    the Bloch Wave Method, Journal of Electron Microscopy Technique, 12
    (1989) 29-55.
  63. J.C.H. Spence, J.M. Zuo, J. Lynch, On the Holz Contribution to Stem
    Lattice Images Formed Using High-Angle Dark-Field Detectors,
    Ultramicroscopy, 31 (1989) 233-240.
  64. J.C.H. Spence, J.M. Zuo, R. Hoier, Accurate Structure-Factor Phase
    Determination by Electron-Diffraction in Noncentrosymmetric Crystals -
    Reply, Physical Review Letters, 63 (1989) 1119-1119.
  65. J.M. Zuo, J.C.H. Spence, M. O'keeffe, Bonding in GaAs, Physical Review
    Letters, 61 (1988) 353-356.
  66. J.C.H. Spence, J.M. Zuo, Large Dynamic-Range, Parallel Detection
    System for Electron-Diffraction and Imaging, Review of Scientific
    Instruments, 59 (1988) 2102-2105.
Professor Jian-Min Zuo Research Group
University of Illinois, Urbana-Champaign