Articles in Refereed Journals

[1] J.M. Zuo, A.B. Shah, H. Kim, Y.F. Meng, W.P. Gao, J.L. Rouviere, Lattice and
strain analysis of atomic resolution Z-contrast images based on template
matching, Ultramicroscopy, 136 (2014) 50-60.
[2] X.F. Zhai, C.S. Mohapatra, A.B. Shah, J.M. Zuo, J.N. Eckstein, Magnetic
properties of the (LaMnO3)(N)/(SrTiO3)(N) atomic layer superlattices, Journal of
Applied Physics, 113 (2013) 173913.
[3] H. Wei, S. House, J.J.X. Wu, J. Zhang, Z.D. Wang, Y. He, E.J. Gao, Y.G. Gao,
H. Robinson, W. Li, J.M. Zuo, I.M. Robertson, Y. Lu, Enhanced and tunable
fluorescent quantum dots within a single crystal of protein, Nano Research, 6
(2013) 627-634.
[4] A.B. Shah, S.T. Sivapalan, B.M. DeVetter, T.K. Yang, J.G. Wen, R.
Bhargava, C.J. Murphy, J.M. Zuo, High-Index Facets in Gold Nanocrystals
Elucidated by Coherent Electron Diffraction, Nano Letters, 13 (2013) 1840-1846.
[5] K.-H. Kim, J.-M. Zuo, Symmetry quantification and mapping using convergent
beam electron diffraction, Ultramicroscopy, 124 (2013) 71-76.
[6] K.H. Kim, D.A. Payne, J.M. Zuo, Determination of fluctuations in local
symmetry and measurement by convergent beam electron diffraction:
applications to a relaxor-based ferroelectric crystal after thermal annealing,
Journal of Applied Crystallography, 46 (2013) 1331-1337.
[7] H. Kim, Y. Meng, J. Rouviere, D. Isheim, D. Seidman, J.M. Zuo, Atomic
resolution mapping of interfacial intermixing and segregation in InAs/GaSb
superlattices: A correlative study, Journal of Applied Physics 113 (2013) 103511.
[8] X. Chen, W.P. Gao, S. Sivaramakrishnan, H.F. Hu, J.M. Zuo, In situ RHEED
study of epitaxial gold nanocrystals on TiO2 (110) surfaces, Applied Surface
Science, 270 (2013) 661–666.
[9] A. Salehi-Khojin, D. Estrada, K.Y. Lin, K. Ran, R.T. Haasch, J.M. Zuo, E. Pop,
R.I. Masel, Chemical sensors based on randomly stacked graphene flakes,
Applied Physics Letters, 100 (2012).
[10] K. Ran, J.-M. Zuo, Q. Chen, Z. Shi, Electrons for single molecule diffraction
and imaging, Ultramicroscopy, 119 (2012) 72-77.
[11] K. Ran, X. Mi, Z.J. Shi, Q. Chen, Y.F. Shi, J.M. Zuo, Molecular packing of
fullerenes inside single-walled carbon nanotubes, Carbon, 50 (2012) 5450-
[12] K. Ran, Q. Chen, J.-M. Zuo, Fabrication and Structure Characterization of
Quasi-2-Dimensional Amorphous Carbon Structures, Acta Physico-Chimica
Sinica, 28 (2012) 1551-1555.
[13] K.H. Kim, D.A. Payne, J.M. Zuo, Symmetry of piezoelectric (1-x)Pb
(Mg1/3Nb2/3)O-3-xPbTiO(3) (x=0.31) single crystal at different length scales in
the morphotropic phase boundary region, Physical Review B, 86 (2012) 184113.
[14] H.F. Hu, J.M. Zuo, M. Zheng, J.N. Eckstein, W.K. Park, L.H. Greene, J.S.
Wen, Z.J. Xu, Z.W. Lin, Q. Li, G.D. Gu, Structure of the oxygen-annealed
chalcogenide superconductor Fe1.08Te0.55Se0.45Ox, Physical Review B, 85
(2012) 064504.
[15] L. Fang, Y. Jia, C. Chaparro, G. Sheet, H. Claus, M.A. Kirk, A.E. Koshelev,
U. Welp, G.W. Crabtree, W.K. Kwok, S. Zhu, H.F. Hu, J.M. Zuo, H.H. Wen, B.
Shen, High, magnetic field independent critical currents in (Ba,K)Fe2As2
crystals, Applied Physics Letters, 101 (2012).
[16] J.M. Zuo, J. Zhang, W.J. Huang, K. Ran, B. Jiang, Combining Real and
Reciprocal Space Information for Aberration Free Coherent Electron Diffractive
Imaging Ultramicroscopy, 111 (2011) 817-823.
[17] J.M. Zuo, J. Tao, Scanning Electron Nanodiffraction and Diffraction Imaging,
in: S. Pennycook, P. Nellist (Eds.) Scanning Transmission Electron Microscopy,
Springer, New York, 2011.
[18] J.S. Wu, Y.S. Zhao, H.F. Hu, J.X. Huang, J.M. Zuo, V.P. Dravid, Construction
of an organic crystal structural model based on combined electron and powder
X-ray diffraction data and the charge flipping algorithm, Ultramicroscopy, 111
(2011) 812-816.
[19] H. Wei, Z.D. Wang, J.O. Zhang, S. House, Y.G. Gao, L.M. Yang, H.
Robinson, L.H. Tan, H. Xing, C.J. Hou, I.M. Robertson, J.M. Zuo, Y. Lu, Time-
dependent, protein-directed growth of gold nanoparticles within a single crystal
of lysozyme, Nature Nanotechnology, 6 (2011) 92-96.
[20] J.C. Shin, K.H. Kim, K.J. Yu, H.F. Hu, L.J. Yin, C.Z. Ning, J.A. Rogers, J.M.
Zuo, X.L. Li, In(x)Ga(1-x)As Nanowires on Silicon: One-Dimensional
Heterogeneous Epitaxy, Bandgap Engineering, and Photovoltaics, Nano Letters,
11 (2011) 4831-4838.
[21] A.B. Shah, Q.M. Ramasse, J.G. Wen, A. Bhattacharya, J.M. Zuo, Practical
spatial resolution of electron energy loss spectroscopy in aberration corrected
scanning transmission electron microscopy, Micron, 42 (2011) 539-546.
[22] H.C. Seo, S. Sivaramakrishnan, J.M. Zuo, L. Pang, P.T. Krein, K. Kim,
Interface analysis of Ti/Al/Ti/Au ohmic contacts with regrown n(+)-GaN layers
using molecular beam epitaxy, Surface and Interface Analysis, 43 (2011) 1627-
[23] K. Ran, J.M. Zuo, Q. Chen, Z.J. Shi, Electron Beam Stimulated Molecular
Motions, Acs Nano, 5 (2011) 3367-3372.
[24] B.B. Nelson-Cheeseman, A.B. Shah, T.S. Santos, S.D. Bader, J.M. Zuo, A.
Bhattacharya, Cation-ordering effects in the single layered manganite La(2/3)Sr
(4/3)MnO(4), Applied Physics Letters, 98 (2011) 072505.
[25] G.H. Lee, J.M. Zuo, TEM observation of growth and phase transformation in
nanometer-sized titanium oxide powder, Journal of Materials Science, 46 (2011)
[26] C.T. Koch, J.M. Zuo, H. Chapman, Introduction to the special issue in honor
of Regents' Prof. John C.H. Spence in occasion of his 65th birthday,
Ultramicroscopy, 111 (2011) 745-746.
[27] Y. Huang, J.H. Ryou, R.D. Dupuis, D. Zuo, B. Kesler, S.L. Chuang, H.F. Hu,
K.H. Kim, Y.T. Lu, K.C. Hsieh, J.M. Zuo, Strain-balanced InAs/GaSb type-II
superlattice structures and photodiodes grown on InAs substrates by
metalorganic chemical vapor deposition, Applied Physics Letters, 99 (2011)
[28] H.F. Hu, J.M. Zuo, J.S. Wen, Z.J. Xu, Z.W. Lin, Q. Li, G.D. Gu, W.K. Park, L.
H. Greene, Phase separation in the iron chalcogenide superconductor Fe(1+y)
Te(x)Se(1-x), New Journal of Physics, 13 (2011) 053031.
[29] S.W. Chee, S. Sivaramakrishnan, R. Sharma, J.M. Zuo, Electron-Beam-
Induced Growth of TiO(2) Nanostructures, Microscopy and Microanalysis, 17
(2011) 274-278.
[30] J.M. Zuo, J. Tao, Scanning Electron Nanodiffraction and Diffraction Imaging,
in:  Scanning Transmission Electron Microscopy, Springer, 2010.
[31] J. Zhang, J.L. Xiao, X.H. Meng, C. Monroe, Y.G. Huang, J.M. Zuo, Free
Folding of Suspended Graphene Sheets by Random Mechanical Stimulation,
Physical Review Letters, 104 (2010) 166805.
[32] X.F. Zhai, C.S. Mohapatra, A.B. Shah, J.M. Zuo, J.N. Eckstein, New Optical
Absorption Bands in Atomic-Layer Superlattices, Advanced Materials, 22 (2010)
[33] J. Ye, Y.H. Li, R. Averback, J.M. Zuo, P. Bellon, Atomistic modeling of
nanoscale patterning of L1(2) order induced by ion irradiation, Journal of
Applied Physics, 108 (2010).
[34] J.G. Wen, J. Mabon, C.H. Lei, S. Burdin, E. Sammann, I. Petrov, A.B. Shah,
V. Chobpattana, J. Zhang, K. Ran, J.M. Zuo, S. Mishina, T. Aoki, The Formation
and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the
Aberration-Corrected Transmission Electron Microscope at the University of
Illinois, Microscopy and Microanalysis, 16 (2010) 183-193.
[35] B.M. Venkatesan, A.B. Shah, J.M. Zuo, R. Bashir, DNA Sensing Using
Nanocrystalline Surface-Enhanced Al2O3 Nanopore Sensors, Advanced
Functional Materials, 20 (2010) 1266-1275.
[36] S. Sivaramakrishnan, J.G. Wen, M.E. Scarpelli, B.J. Pierce, J.M. Zuo,
Equilibrium shapes and triple line energy of epitaxial Gold nanocrystals
supported on TiO2 (110), Physical Review B, 82 (2010) 195421.
[37] S. Sivaramakrishnan, A.P. Tedjasaputra, K. Sato, J.M. Zuo, Structural
evolution, epitaxy, and sublimation of silver nanoclusters on TiO2 (110), Journal
of Applied Physics, 107 (2010) 053505.
[38] A.B. Shah, Q.M. Ramasse, X.F. Zhai, J.G. Wen, S.J. May, I. Petrov, A.
Bhattacharya, P. Abbamonte, J.N. Eckstein, J.M. Zuo, Probing Interfacial
Electronic Structures in Atomic Layer LaMnO3 and SrTiO3 Superlattices,
Advanced Materials, 22 (2010) 1156-+.
[39] A.B. Shah, Q.M. Ramasse, S.J. May, J. Kavich, J.G. Wen, X. Zhai, J.N.
Eckstein, J. Freeland, A. Bhattacharya, J.M. Zuo, Presence and spatial
distribution of interfacial electronic states in LaMnO3-SrMnO3 superlattices,
Physical Review B, 82 (2010) 115112.
[40] S.I. Sanchez, M.W. Small, S. Sivaramakrishnan, J.G. Wen, J.M. Zuo, R.G.
Nuzzo, Visualizing Materials Chemistry at Atomic Resolution, Analytical
Chemistry, 82 (2010) 2599-2607.
[41] H. Park, J.M. Zuo, Comment on "Structural Preablation Dynamics of
Graphite Observed by Ultrafast Electron Crystallography", Physical Review
Letters, 105 (2010) 059603.
[42] H. McDaniel, J.M. Zuo, M. Shim, Anisotropic Strain-Induced Curvature in
Type-II CdSe/CdTe Nanorod Heterostructures, Journal of the American
Chemical Society, 132 (2010) 3286-3287.
[43] T. Kim, G. Kim, W.I. Choi, Y.K. Kwon, J.M. Zuo, Electrical transport in small
bundles of single-walled carbon nanotubes: Intertube interaction and effects of
tube deformation, Applied Physics Letters, 96 (2010) 173107.
[44] S. Kim, J.M. Zuo, S. Kang, Effect of WC or NbC addition on lattice
parameter of surrounding structure in Ti(C0.7N0.3)-Ni cermets investigated by
TEM/CBED, Journal of the European Ceramic Society, 30 (2010) 2131-2138.
[45] K.H. Kim, D.A. Payne, J.M. Zuo, Ion-beam induced domain structure in
piezoelectric PMN-PT single crystal, Applied Physics Letters, 97 (2010) 261910.
[46] B. Jiang, J.M. Zuo, D. Holec, C.J. Humphreys, M. Spackman, J.C.H. Spence,
Combined structure-factor phase measurement and theoretical calculations for
mapping of chemical bonds in GaN, Acta Crystallographica Section A, 66 (2010)
[47] W. Chern, K. Hsu, I.S. Chun, B.P. de Azeredo, N. Ahmed, K.H. Kim, J.M.
Zuo, N. Fang, P. Ferreira, X.L. Li, Nonlithographic Patterning and Metal-Assisted
Chemical Etching for Manufacturing of Tunable Light-Emitting Silicon Nanowire
Arrays, Nano Letters, 10 (2010) 1582-1588.
[48] Y.K. Che, X.M. Yang, Z.X. Zhang, J.M. Zuo, J.S. Moore, L. Zang, Ambient
photodoping of p-type organic nanofibers: highly efficient photoswitching and
electrical vapor sensing of amines, Chemical Communications, 46 (2010) 4127-
[49] S.A. Chambers, M.H. Engelhard, V. Shutthanandan, Z. Zhu, T.C. Droubay,
L. Qiao, P.V. Sushko, T. Feng, H.D. Lee, T. Gustafsson, E. Garfunkel, A.B.
Shah, J.M. Zuo, Q.M. Ramasse, Instability, intermixing and electronic structure
at the epitaxial LaAlO3/SrTiO3(001) heterojunction, Surface Science Reports,
65 (2010) 317-352.
[50] J. Zhang, J.M. Zuo, Structure and diameter-dependent bond lengths of a
multi-walled carbon nanotube revealed by electron diffraction, Carbon, 47
(2009) 3515-3528.
[51] X.L. Wei, Q. Chen, S.Y. Xu, L.M. Peng, J.M. Zuo, Beam to String Transition
of Vibrating Carbon Nanotubes Under Axial Tension, Advanced Functional
Materials, 19 (2009) 1753-1758.
[52] J. Tao, D. Niebieskikwiat, M. Varela, W. Luo, M.A. Schofield, Y. Zhu, M.B.
Salamon, J.M. Zuo, S.T. Pantelides, S.J. Pennycook, Direct Imaging of
Nanoscale Phase Separation in La0.55Ca0.45MnO3: Relationship to Colossal
Magnetoresistance, Physical Review Letters, 103 (2009) 097202.
[53] K. Sato, J.G. Wen, J.M. Zuo, Intermetallic ordering and structure in Fe-Pd
alloy nanoparticles, Journal of Applied Physics, 105 (2009) 093509.
[54] S.I. Sanchez, M.W. Small, J.M. Zuo, R.G. Nuzzo, Structural Characterization
of Pt-Pd and Pd-Pt Core-Shell Nanoclusters at Atomic Resolution, Journal of the
American Chemical Society, 131 (2009) 8683-8689.
[55] H. Park, J.M. Zuo, Direct measurement of transient electric fields induced by
ultrafast pulsed laser irradiation of silicon, Applied Physics Letters, 94 (2009)
[56] W.J. Huang, J.M. Zuo, B. Jiang, K.W. Kwon, M. Shim, Sub-angstrom-
resolution diffractive imaging of single nanocrystals, Nature Physics, 5 (2009)
[57] C. Day, Nanoscale phase competition accompanies colossal
magnetoresistance, Physics Today, 62 (2009) 20-23.
[58] Y.K. Che, X.M. Yang, K. Balakrishnan, J.M. Zuo, L. Zang, Highly Polarized
and Self-Waveguided Emission from Single-Crystalline Organic Nanobelts,
Chemistry of Materials, 21 (2009) 2930-2934.
[59] A.B. Shah, X.F. Zhai, B. Jiang, J.G. Wen, J.N. Eckstein, J.M. Zuo, Electron
energy-loss study of the electronic structure of atomic scale SrTiO3-SrMnO3-
LaMnO3 superlattices, Physical Review B, 77 (2008) 115103.
[60] D. Niebieskikwiat, J. Tao, J.M. Zuo, M.B. Salamon, Time-dependent
phenomena in phase-separated electron-doped manganites, Physical Review
B, 78 (2008) 014434.
[61] S.J. May, A.B. Shah, S. Velthuis, M.R. Fitzsimmons, J.M. Zuo, X. Zhai, J.N.
Eckstein, S.D. Bader, A. Bhattacharya, Magnetically asymmetiric interfaces in a
LaMnO3/SrMnG(3) superlattice due to structural asymmetries, Physical Review
B, 77 (2008) 174409.
[62] T. Kim, S. Kim, E. Olson, J.M. Zuo, In situ measurements and transmission
electron microscopy of carbon nanotube field-effect transistors,
Ultramicroscopy, 108 (2008) 613-618.
[63] S.W. Kim, J.M. Zuo, N.T. Nguyen, D.C. Johnson, D.G. Cahill, Structure of
layered WSe2 thin films with ultralow thermal conductivity, Journal of Materials
Research, 23 (2008) 1064-1067.
[64] Y.Y. Jiang, W. Zhou, T. Kim, Y. Huang, J.M. Zuo, Measurement of radial
deformation of single-wall carbon nanotubes induced by intertube van der
Waals forces, Physical Review B, 77 (2008) 153405.
[65] D. Jacob, J.M. Zuo, A. Lefebvre, Y. Cordier, Composition analysis of
semiconductor quantum wells by energy filtered convergent-beam electron
diffraction, Ultramicroscopy, 108 (2008) 358-366.
[66] W.J. Huang, R. Sun, J. Tao, L.D. Menard, R.G. Nuzzo, J.M. Zuo,
Coordination-dependent surface atomic contraction in nanocrystals revealed by
coherent diffraction, Nature Materials, 7 (2008) 308-313.
[67] I.S. Chun, V.B. Verma, V.C. Elarde, S.W. Kim, J.M. Zuo, J.J. Coleman, X. Li,
InGaAs/GaAs 3D architecture formation by strain-induced self-rolling with
lithographically defined rectangular stripe arrays, Journal of Crystal Growth, 310
(2008) 2353-2358.
[68] A. Bhattacharya, S.J. May, S. Velthuis, M. Warusawithana, X. Zhai, B. Jiang,
J.M. Zuo, M.R. Fitzsimmons, S.D. Bader, J.N. Eckstein, Metal-insulator transition
and its relation to magnetic structure in (LaMnO3)(2n)/(SrMnO3)(n)
superlattices, Physical Review Letters, 100 (2008) 257203.
[69] J.M. Zuo, T. Kim, A. Celik-Aktas, J. Tao, Quantitative structural analysis of
individual nanotubes by electron diffraction, Zeitschrift Fur Kristallographie, 222
(2007) 625-633.
[70] J.M. Zuo, T. Kim, A. Celik-Aktas, J. Tao, Quantitative Structural Analysis of
Individual Nanotubes by Electron Diffraction, Zeitschrift fur Kristallographie, 222
(2007) 625-633.
[71] W. Zhou, Y. Huang, B. Liu, K.C. Hwang, J.M. Zuo, M.J. Buehler, H. Gao, Self-
folding of single- and multiwall carbon nanotubes, Applied Physics Letters, 90
(2007) 073107.
[72] S. Smadici, P. Abbamonte, A. Bhattacharya, X.F. Zhai, B. Jiang, A. Rusydi, J.
N. Eckstein, S.D. Bader, J.M. Zuo, Electronic reconstruction at SrMnO3-LaMnO3
superlattice interfaces, Physical Review Letters, 99 (2007) 196404.
[73] K. Sato, W.J. Huang, F. Bohra, S. Sivaramakrishnan, A.P. Tedjasaputra, J.
M. Zuo, Size-dependent structural transition from multiple-twinned particles to
epitaxial fcc nanocrystals and nanocrystal decay, Physical Review B, 76 (2007)
[74] G.S. Park, J.H. Kwon, M. Kim, H.R. Yoon, W. Jo, T.K. Kim, J.M. Zuo, Y.
Khang, Crystalline and amorphous structures of Ge-Sb-Te nanoparticles,
Journal of Applied Physics, 102 (2007) 013524.
[75] G.S. Park, S.C. Bae, S. Granick, J.H. Lee, S.D. Bae, T. Kim, J.M. Zuo,
Naturally formed epitaxial diamond crystals in rubies, Diamond and Related
Materials, 16 (2007) 397-400.
[76] W.J. Huang, B. Jiang, R.S. Sun, J.M. Zuo, Towards sub-A atomic resolution
electron diffraction imaging of metallic nanoclusters: A simulation study of
experimental parameters and reconstruction algorithms, Ultramicroscopy, 107
(2007) 1159-1170.
[77] H. Chen, J.M. Zuo, Structure and phase separation of Ag-Cu alloy thin films,
Acta Materialia, 55 (2007) 1617-1628.
[78] A. Celik-Aktas, J.F. Stubbins, J.M. Zuo, Electron beam machining of
nanometer-sized tips from multiwalled boron nitride nanotubes, Journal of
Applied Physics, 102 (2007) 024310.
[79] P.H.C. Camargo, Y. Xiong, L. Ji, J.M. Zuo, Y. Xia, Facile synthesis of
tadpole-like nanostructures consisting of Au heads and Pd tails, Journal of the
American Chemical Society, 129 (2007) 15452-+.
[80] G.L. Brennecka, D.A. Payne, P. Sarin, J.M. Zuo, W.M. Kriven, H. Hellwig,
Phase transformations in the high-temperature form of pure and TiO2-stabilized
Ta2O5, Journal of the American Ceramic Society, 90 (2007) 2947-2953.
[81] F. Bohra, B. Jiang, J.M. Zuo, Textured crystallization of ultrathin hafnium
oxide films on silicon substrate, Applied Physics Letters, 90 (2007) 161917.
[82] K.D. Matthews, M.G. Lemaitre, T. Kim, H. Chen, M. Shim, J.M. Zuo, Growth
modes of carbon nanotubes on metal substrates, Journal of Applied Physics,
100 (2006) 044309.
[83] W.J. Huang, H. Chen, J.M. Zuo, One-dimensional self-assembly of metallic
nanostructures on single-walled carbon nanotube bundles, Small, 2 (2006)
[84] M. Gao, J.M. Zuo, R. Zhang, L.A. Nagahara, Structure determinations of
double-wall carbon nanotubes grown by catalytic chemical vapor deposition,
Journal of Materials Science, 41 (2006) 4382-4388.
[85] K. Balakrishnan, A. Datar, W. Zhang, X.M. Yang, T. Naddo, J.L. Huang, J.M.
Zuo, M. Yen, J.S. Moore, L. Zang, Nanofibril self-assembly of an arylene
ethynylene macrocycle, Journal of the American Chemical Society, 128 (2006)
[86] S. Agan, A. Celik-Aktas, J.M. Zuo, A. Dana, A. Aydinli, Synthesis and size
differentiation of Ge nanocrystals in amorphous SiO2, Applied Physics a-
Materials Science & Processing, 83 (2006) 107-110.
[87] J.M. Zuo, B.Q. Li, Nanocluster interfaces and epitaxy: Ag on Si surfaces,
Zeitschrift Fur Metallkunde, 96 (2005) 438-442.
[88] L.C. Yang, C.S. Hsu, G.S. Chen, C.C. Fu, J.M. Zuo, B.Q. Lee,
Strengthening TiN diffusion barriers for Cu metallization by lightly doping Al,
Applied Physics Letters, 87 (2005).
[89] J. Tao, D. Niebieskikwiat, M.B. Salamon, J.M. Zuo, Lamellar phase
separation and dynamic competition in La0.23Ca0.77MnO3, Physical Review
Letters, 94 (2005).
[90] C.W. Lim, C.S. Shin, D. Gall, J.M. Zuo, I. Petrov, J.E. Greene, Growth of
CoSi2 on Si(001) by reactive deposition epitaxy, Journal of Applied Physics, 97
[91] B.Q. Li, J.M. Zuo, Structure and shape transformation from multiply twinned
particles to epitaxial nanocrystals: Importance of interface on the structure of Ag
nanoparticles, Physical Review B, 72 (2005) 085434.
[92] T. Kim, J.M. Zuo, E.A. Olson, I. Petrov, Imaging suspended carbon
nanotubes in field-effect transistors configured with microfabricated slits for
transmission electron microscopy, Applied Physics Letters, 87 (2005) 173108.
[93] W.J. Huang, B.Q. Li, J.M. Zuo, Diffusion-limited submonolayer pentacene
thin film growth on hydrogen-passivated Si(111) substrates, Surface Science,
595 (2005) 157-164.
[94] A. Celik-Aktas, J.M. Zuo, J.F. Stubbins, C.C. Tang, Y. Bando, Double-helix
structure in multiwall boron nitride nanotubes, Acta Crystallographica Section A,
61 (2005) 533-541.
[95] A. Celik-Aktas, J.M. Zuo, J.F. Stubbins, C. Tang, Y. Bando, Structure and
chirality distribution of multiwalled boron nitride nanotubes, Applied Physics
Letters, 86 (2005).
[96] K. Balakrishnan, A. Datar, R. Oitker, H. Chen, J.M. Zuo, L. Zang, Nanobelt
self-assembly from an organic n-type semiconductor: Propoxyethyl-PTCDI,
Journal of the American Chemical Society, 127 (2005) 10496-10497.
[97] J.M. Zuo, M. Gao, J. Tao, B.Q. Li, R. Twesten, I. Petrov, Coherent nano-
area electron diffraction, Microscopy Research and Technique, 64 (2004) 347-
[98] J.M. Zuo, Measurements of electron densities in solids: a real-space view of
electronic structure and bonding in inorganic crystals, Reports on Progress in
Physics, 67 (2004) 2053-2103.
[99] J. Tao, J.M. Zuo, Nanoscale phase competition during charge ordering in
intrinsically strained La0.33Ca0.67MnO3, Physical Review B, 69 (2004).
[100] B.Q. Li, W. Swiech, J.A. Venables, J.M. Zuo, A LEEM study of bamboo-like
growth of Ag crystals on Si(001) surfaces, Surface Science, 569 (2004) 142-
[101] M. Kim, J.M. Zuo, G.S. Park, High-resolution strain measurement in
shallow trench isolation structures using dynamic electron diffraction, Applied
Physics Letters, 84 (2004) 2181-2183.
[102] B. Jiang, J. Friis, R. Holmestad, J.M. Zuo, M. O'Keeffe, J.C.H. Spence,
Electron density and implication for bonding in Cu, Physical Review B, 69 (2004).
[103] J.M. Zuo, I. Vartanyants, M. Gao, R. Zhang, L.A. Nagahara, Atomic
resolution imaging of a carbon nanotube from diffraction intensities, Science,
300 (2003) 1419-1421.
[104] Z.L. Wang, X.Y. Kong, J.M. Zuo, Induced growth of asymmetric
nanocantilever arrays on polar surfaces, Physical Review Letters, 91 (2003).
[105] J. Pacaud, J.M. Zuo, R. Hoier, S. Matsumura, Quantitative electron
diffraction evidence for one-dimensional ordering in magnetite above the
Verwey transition, Microscopy and Microanalysis, 9 (2003) 475-483.
[106] B.Q. Li, J.M. Zuo, Self-assembly of epitaxial Ag nanoclusters on H-
terminated Si(111) surfaces, Journal of Applied Physics, 94 (2003) 743-748.
[107] B. Jiang, J.M. Zuo, N. Jiang, M. O'Keeffe, J.C.H. Spence, Charge density
and chemical bonding in rutile, TiO2, Acta Crystallographica Section A, 59
(2003) 341-350.
[108] B. Jiang, J.M. Zuo, J. Friis, J.C.H. Spence, On the consistency of QCBED
structure factor measurements for TiO2 (rutile), Microscopy and Microanalysis,
9 (2003) 457-467.
[109] M. Gao, J.M. Zuo, R.D. Twesten, I. Petrov, L.A. Nagahara, R. Zhang,
Structure determination of individual single-wall carbon nanotubes by nanoarea
electron diffraction, Applied Physics Letters, 82 (2003) 2703-2705.
[110] B. Chen, M. Gao, J.M. Zuo, S. Qu, B. Liu, Y. Huang, Binding energy of
parallel carbon nanotubes, Applied Physics Letters, 83 (2003) 3570-3571.
[111] J.K. Bording, B.Q. Li, Y.F. Shi, J.M. Zuo, Size- and shape-dependent
energetics of nanocrystal interfaces: Experiment and simulation, Physical
Review Letters, 90 (2003).
[112] J.M. Zuo, B.Q. Li, Nanostructure evolution during cluster growth: Ag on H-
terminated Si(111) surfaces, Physical Review Letters, 88 (2002).
[113] J.M. Zuo, Quantitative electron incoherent scattering and application to
nanometre-sized charge ordering in La2/3Ca1/3MnO3, Journal of Electron
Microscopy, 51 (2002) S67-S72.
[114] Y. Murakami, D. Shindo, M. Kikuchi, J.M. Zuo, J.C.H. Spence, Resonance
effect in ELNES from perovskite-type manganites BiMnO3 and LaMnO3, Journal
of Electron Microscopy, 51 (2002) 99-103.
[115] B.Q. Li, J.M. Zuo, The development of epitaxy of nanoclusters on lattice-
mismatched substrates: Ag on H-Si(111) surfaces, Surface Science, 520 (2002)
[116] B.Q. Li, I. Kojima, J.M. Zuo, Surface evolution of ultrahigh vacuum
magnetron sputter deposited amorphous SiO2 thin films, Journal of Applied
Physics, 91 (2002) 4082-4089.
[117] B. Jiang, J.M. Zuo, Q. Chen, J.C.H. Spence, Orbital ordering in LaMnO3:
estimates of structure factors and comparison of measurement methods, Acta
Crystallographica Section A, 58 (2002) 4-11.
[118] J.M. Zuo, J. Tao, Nanometer-sized regions of charge ordering and charge
melting in La2/3Ca1/3MnO3 revealed by electron microdiffraction, Physical
Review B, 6305 (2001).
[119] E.A. Zhurova, J.M. Zuo, V.G. Tsirelson, Topological analysis of
electrostatic potential in SrTiO3, Journal of Physics and Chemistry of Solids, 62
(2001) 2143-2146.
[120] J.C.H. Spence, M. O'Keeffe, J.M. Zuo, Have orbitals really been
observed?, Journal of Chemical Education, 78 (2001) 877-877.
[121] Q. Chen, J. Tao, J.M. Zuo, J.C.H. Spence, Microstructure of La1-
xCaxMnO3 studied by transmission electron microscopy, Journal of Materials
Research, 16 (2001) 2959-2965.
[122] J.M. Zuo, U. Weierstall, L.M. Peng, J.C.H. Spence, Surface structural
sensitivity of convergent-beam RHEED: Si (001)2x1 models compared with
dynamical simulations, Ultramicroscopy, 81 (2000) 235-244.
[123] J.M. Zuo, J. Pacaud, R. Hoier, J.C.H. Spence, Experimental measurement
of electron diffuse scattering in magnetite using energy-filter and imaging
plates, Micron, 31 (2000) 527-532.
[124] J.M. Zuo, M. O'Keeffe, M. Kim, J.C.H. Spence, On closed-shell
interactions, polar covalences, d shell moles, and direct images of orbitals: The
case of cuprite - Response to the essay by S. G. Wang and W. H. E. Schwarz,
Angewandte Chemie-International Edition, 39 (2000) 3791-3794.
[125] J.M. Zuo, Electron detection characteristics of a slow-scan CCD camera,
imaging plates and film, and electron image restoration, Microscopy Research
and Technique, 49 (2000) 245-268.
[126] S.L. Dudarev, L.M. Peng, S.Y. Savrasov, J.M. Zuo, Correlation effects in
the ground-state charge density of Mott insulating NiO: A comparison of ab initio
calculations and high-energy electron diffraction measurements, Physical
Review B, 61 (2000) 2506-2512.
[127] J.M. Zuo, M. Kim, M. O'Keeffe, J.C.H. Spence, Direct observation of d-
orbital holes and Cu-Cu bonding in Cu2O, Nature, 401 (1999) 49-52.
[128] J.M. Zuo, Accurate structure refinement and measurement of crystal
charge distribution using convergent beam electron diffraction, Microscopy
Research and Technique, 46 (1999) 220-233.
[129] U. Weierstall, J.M. Zuo, T. Kjorsvik, J.C.H. Spence, Convergent-beam
RHEED in a dedicated UHV diffraction camera and applications to Si
reconstructed surfaces, Surface Science, 442 (1999) 239-250.
[130] J.C.H. Spence, B. Calef, J.M. Zuo, Dynamic inversion by the method of
generalized projections, Acta Crystallographica Section A, 55 (1999) 112-118.
[131] L.M. Peng, J.M. Zuo, Anisotropic dispersion of the band structure and
formation of ring patterns in CBED, Acta Crystallographica Section A, 55 (1999)
[132] X.M.H. Huang, J.M. Zuo, J.C.H. Spence, Wavefront reconstruction for in-
line holograms formed by pure amplitude objects, Applied Surface Science, 148
(1999) 229-234.
[133] H.X. Gao, L.M. Peng, J.M. Zuo, Lattice dynamics and Debye-Waller factors
of some compounds with the sodium chloride structure, Acta Crystallographica
Section A, 55 (1999) 1014-1025.
[134] A.S. Avilov, A.K. Kuligin, U. Pietsch, J.C.H. Spence, V.G. Tsirelson, J.M.
Zuo, Scanning system for high-energy electron diffractometry, Journal of
Applied Crystallography, 32 (1999) 1033-1038.
[135] J.M. Zuo, M. Kim, R. Holmestad, A new approach to lattice parameter
measurements using dynamic electron diffraction and pattern matching, Journal
of Electron Microscopy, 47 (1998) 121-127.
[136] J.M. Zuo, Quantitative convergent beam electron diffraction, Materials
Transactions Jim, 39 (1998) 938-946.
[137] M.Y. Kim, J.M. Zuo, J.C.H. Spence, Ab-initio LDA calculations of the mean
Coulomb potential V-0 in slabs of crystalline Si, Ge and MgO, Physica Status
Solidi a-Applied Research, 166 (1998) 445-451.
[138] J.M. Zuo, M. Okeeffe, P. Rez, J.C.H. Spence, Charge density of MgO:
Implications of precise new measurements for theory, Physical Review Letters,
78 (1997) 4777-4780.
[139] J.M. Zuo, P. Blaha, K. Schwarz, The theoretical charge density of silicon:
Experimental testing of exchange and correlation potentials, Journal of Physics-
Condensed Matter, 9 (1997) 7541-7561.
[140] J.C.H. Spence, J.M. Zuo, Does electron holography energy-filter?,
Ultramicroscopy, 69 (1997) 185-190.
[141] J.C.H. Spence, X. Zhang, U. Weierstall, J.M. Zuo, E. Munro, J. Rouse, Low
energy point reflection electron microscopy, Surface Review and Letters, 4
(1997) 577-587.
[142] G. Ren, J.M. Zuo, L.M. Peng, Accurate measurements of crystal structure
factors using a FEG electron microscope, Micron, 28 (1997) 459-467.
[143] J.P. Morniroli, P. Cordier, E. Van Cappellen, J.M. Zuo, J. Spence,
Application of the Convergent Beam Imaging (CBIM) technique to the analysis of
crystal defects, Microscopy Microanalysis Microstructures, 8 (1997) 187-202.
[144] R. Holmestad, J.P. Morniroli, J.M. Zuo, J.C.H. Spence, A. Avilov,
Quantitative CBED studies of SiC 4H, in:  Electron Microscopy and Analysis
1997, 1997, pp. 137-140.
[145] J.M. Zuo, M.R. McCartney, J.C.H. Spence, Performance of imaging plates
for electron recording, Ultramicroscopy, 66 (1996) 35-47.
[146] J.M. Zuo, Electron detection characteristics of slow-scan CCD camera,
Ultramicroscopy, 66 (1996) 21-33.
[147] D. Shindo, A. Gomyo, J.M. Zuo, J.C.H. Spence, Short-range ordered
structure of Ga0.47In0.53As studied by energy-filtered electron diffraction and
HREM, Journal of Electron Microscopy, 45 (1996) 99-104.
[148] J.M. Zuo, A.L. Weickenmeier, On the Beam Selection and Convergence in
the Bloch-Wave Method, Ultramicroscopy, 57 (1995) 375-383.
[149] L.M. Peng, J.M. Zuo, Direct Retrieval of Crystal-Structure Factors in
Theed, Ultramicroscopy, 57 (1995) 1-9.
[150] R. Holmestad, J.M. Zuo, J.C.H. Spence, R. Hoier, Z. Horita, Effect of Mn
Doping on Charge-Density in Gamma-Tial by Quantitative Convergent-Beam
Electron-Diffraction, Philosophical Magazine a-Physics of Condensed Matter
Structure Defects and Mechanical Properties, 72 (1995) 579-601.
[151] Y.M. Zhu, J.M. Zuo, A.R. Moodenbaugh, M. Suenaga, Grain-Boundary
Constraint and Oxygen Deficiency in Yba2cu3o7-Delta - Application of the
Coincidence Site Lattice Model to a Noncubic System, Philosophical Magazine a-
Physics of Condensed Matter Structure Defects and Mechanical Properties, 70
(1994) 969-984.
[152] J.C.H. Spence, J.M. Zuo, M. Okeeffe, K. Marthinsen, R. Hoier, On the
Minimum Number of Beams Needed to Distinguish Enantiomorphs in X-Ray and
Electron-Diffraction, Acta Crystallographica Section A, 50 (1994) 647-650.
[153] J.M. Zuo, J.C.H. Spence, J. Downs, J. Mayer, Measurement of Individual
Structure-Factor Phases with 10th-Degree Accuracy - the 00.2 Reflection in
Beo Studied by Electron and X-Ray-Diffraction, Acta Crystallographica Section
A, 49 (1993) 422-429.
[154] J.M. Zuo, J.C.H. Spence, Coherent Electron Nanodiffraction from Perfect
and Imperfect Crystals, Philosophical Magazine a-Physics of Condensed Matter
Structure Defects and Mechanical Properties, 68 (1993) 1055-1078.
[155] J.M. Zuo, Automated Structure-Factor Refinement from Convergent-Beam
Electron-Diffraction Patterns, Acta Crystallographica Section A, 49 (1993) 429-
[156] J.M. Zuo, New Method of Bravais Lattice Determination, Ultramicroscopy,
52 (1993) 459-464.
[157] J.Z. Tong, J.M. Zuo, L. Eyring, A Transmission Electron-Microscopy
Diffraction and Simulation Method for Early-Stage Studies of the Evolution of
Gel-Derived Zirconia Precursors, Journal of the American Ceramic Society, 76
(1993) 857-864.
[158] J.C.H. Spence, J.M. Cowley, J.M. Zuo, Electron Holographic Study of
Ferroelectric Domain-Walls - Comment, Applied Physics Letters, 62 (1993)
[159] W. Qian, J.C.H. Spence, J.M. Zuo, Transmission Low-Energy-Electron
Diffraction (Tleed) and Its Application to the Low-Voltage Point-Projection
Microscope, Acta Crystallographica Section A, 49 (1993) 436-445.
[160] R. Holmestad, A.L. Weickenmeier, J.M. Zuo, J.C.H. Spence, Z. Horita,
Debye-Waller Factor Measurements in Tial from Holz Line-Intensities, in:  
Electron Microscopy and Analysis 1993, 1993, pp. 141-144.
[161] M. Gajdardziskajosifovska, M.R. McCartney, W.J. Deruijter, D.J. Smith, J.K.
Weiss, J.M. Zuo, Accurate Measurements of Mean Inner Potential of Crystal
Wedges Using Digital Electron Holograms, Ultramicroscopy, 50 (1993) 285-299.
[162] J.M. Zuo, J. Liu, Resonance Effects in Rheed on Gaas(110) Surface,
Surface Science, 271 (1992) 253-259.
[163] J.M. Zuo, Automated Lattice-Parameter Measurement from Holz Lines and
Their Use for the Measurement of Oxygen-Content in Yba2cu3o7-Delta from
Nanometer-Sized Region, Ultramicroscopy, 41 (1992) 211-223.
[164] J.C.H. Spence, J.M. Zuo, W. Qian, Atomic Resolution in Lensless Low-
Energy Electron Holography - Comment, Physical Review Letters, 68 (1992)
[165] J.C.H. Spence, J.M. Zuo, Electron Microdiffraction, Plenum, New York,
[166] J.M. Zuo, J.C.H. Spence, Automated Structure Factor Refinement from
Convergent-Beam Patterns, Ultramicroscopy, 35 (1991) 185-196.
[167] J.M. Zuo, Perturbation-Theory in High-Energy Transmission Electron-
Diffraction, Acta Crystallographica Section A, 47 (1991) 87-95.
[168] J.M. Zuo, J.C.H. Spence, W. Petuskey, Charge Ordering in Magnetite at
Low-Temperatures, Physical Review B, 42 (1990) 8451-8464.
[169] J.M. Zuo, J.C.H. Spence, M. Okeeffe, Bonding Charge-Density in Gaas -
Reply, Physical Review Letters, 62 (1989) 2329-2329.
[170] J.M. Zuo, J.C.H. Spence, R. Hoier, Accurate Structure-Factor Phase
Determination by Electron-Diffraction in Noncentrosymmetric Crystals, Physical
Review Letters, 62 (1989) 547-550.
[171] J.M. Zuo, R. Hoier, J.C.H. Spence, 3-Beam and Many-Beam Theory in
Electron-Diffraction and Its Use for Structure-Factor Phase Determination in
Non-Centrosymmetric Crystal-Structures, Acta Crystallographica Section A, 45
(1989) 839-851.
[172] J.M. Zuo, K. Gjonnes, J.C.H. Spence, Fortran Source Listing for Simulating
3-Dimensional Convergent Beam Patterns with Absorption by the Bloch Wave
Method, Journal of Electron Microscopy Technique, 12 (1989) 29-55.
[173] J.C.H. Spence, J.M. Zuo, J. Lynch, On the Holz Contribution to Stem
Lattice Images Formed Using High-Angle Dark-Field Detectors, Ultramicroscopy,
31 (1989) 233-240.
[174] J.C.H. Spence, J.M. Zuo, R. Hoier, Accurate Structure-Factor Phase
Determination by Electron-Diffraction in Noncentrosymmetric Crystals - Reply,
Physical Review Letters, 63 (1989) 1119-1119.
[175] J.M. Zuo, J.C.H. Spence, M. O'keeffe, Bonding in GaAs, Physical Review
Letters, 61 (1988) 353-356.
[176] J.C.H. Spence, J.M. Zuo, Large Dynamic-Range, Parallel Detection
System for Electron-Diffraction and Imaging, Review of Scientific Instruments, 59
(1988) 2102-2105.
[177] A. Ourmazd, J.C.H. Spence, J.M. Zuo, C.H. Li, Structural Characterization
of Ba2ycu3o7 by High-Resolution Transmission Electron-Microscopy, Journal of
Electron Microscopy Technique, 8 (1988) 251-262.
[178] R. Hoier, J.M. Zuo, K. Marthinsen, J.C.H. Spence, Determination of
Structure Factor Phase Invariants from Non-Systematic Many-Beam Effects in
Convergent-Beam Patterns, Ultramicroscopy, 26 (1988) 25-30.
[179] R. Hoier, J.M. Zuo, K. Marthinsen, J.C.H. Spence, Structure Factor
Determination from 2-Dimensional Cbed Simulations in Noncentrosymmetric
Crystals, Institute of Physics Conference Series, (1988) 25-26.
Professor Jian-Min Zuo Research Group
University of Illinois, Urbana-Champaign