The Probe, or JProbe, program is designed for interactive simulation of
electron optical properties for probe formation in Scanning Transmission
Electron Microscopy (STEM) and imaging in Transmission Electron Microscopy
(TEM). The JProbe is a Java version written by Eric Olson of University of
Illinois. The program uses a command window for calling/executing functions in
the program and a graphics display for display and interactive processing and
feedback (see Fig. 1). (The DOS version, Probe, is executed and controlled in
a DOS command window. Interaction with display is achieved through the use
of a mouse pointer).

The Probe program has multiple functions for both Cs corrected and
uncorrected STEM/TEM. The basic functions are simulations of: 1) electron
probe, 2) contrast transfer function (CTF), 3) Ronchigram and 4) high
resolution electron images (this function is o
nly available in the DOS version,
). The auxiliary functions include: 1) the input and adjustment of e
lectron microscope optical parameters, 2) the optimization of the electron
probe, 3) calculations of the optimal defocus, and 4) parameters for the
graphics display and plotting. A list of functions can be obtained by typing the
command help.

To download the java program,
CLICK HERE, a file download dialog should
appear, save the file in a folder. Extract the folder to your desktop. Double
click on the JProbe.jar file and follow the instructions to run the program.


Usage of the program is restricted to non-commercial research and
educational purposes.


The University of Illinois Board of Trustees, the Frederick Seitz,
Materials Research Laboratory, the Center for Microanalysis of
Materials and the Authors of the software are not responsible for any
damage that may result from the use or misuse of this software. Access
to this software is provided as the service to the education and
non-commercial research communities. This service and its software
are provided "as-is" with no warranty made regarding the accuracy or
reliability of results or the suitability for any particular application. The
user assumes all risk associated with the usage of this service.
Professor Jian-Min Zuo Research Group
University of Illinois, Urbana-Champaign